Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect.
نویسندگان
چکیده
Multi-beam confocal microscopy without any physical pinhole was demonstrated. As a key device, a custom CMOS image sensor realizing a focal-plane pinhole array effect by special pixel addressing and discarding of the unwanted photocarriers was developed. The axial resolution in the confocal mode measured by FWHM for a planar mirror was 8.9 μm, which showed that the confocality has been achieved with the proposed CMOS image sensor.
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عنوان ژورنال:
- Optics express
دوره 21 2 شماره
صفحات -
تاریخ انتشار 2013